文件名称:vhdl-all-english
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A major obstacle that stands in the way of efficient test
response compaction are the unknown values (x-values) captured
by scan cells during testing. If test responses with
s and the correctness of the
compactor inputs cannot be verified at the c
limited compaction rates
response compaction are the unknown values (x-values) captured
by scan cells during testing. If test responses with
s and the correctness of the
compactor inputs cannot be verified at the c
limited compaction rates
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vhdl-all-english.pdf