文件名称:hierarchical-code
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Abstract—This paper presents a highly effective compactor architecture for processing test responses with a high percentage of x-values. The key component is a hierarchical configurable
masking register, which allows the compactor to dynamically adapt to and provide excellent performance over a wide range
of x-densities. A major contribution of this paper is a technique
that enables the efficient loading of the x-masking data into
the masking logic in a parallel fashion using the scan chains.
A method for eliminating the requirement for dedicated mask control signals using automated test equipment timing flexibility is also presented. The proposed compactor is especially suited to multisite te -Abstract—This paper presents a highly effective compactor architecture for processing test responses with a high percentage of x-values. The key component is a hierarchical configurable
masking register, which allows the compactor to dynamically adapt to and provide excellent performance over a wide range
of x-densities. A major contribution of this paper is a technique
that enables the efficient loading of the x-masking data into
the masking logic in a parallel fashion using the scan chains.
A method for eliminating the requirement for dedicated mask control signals using automated test equipment timing flexibility is also presented. The proposed compactor is especially suited to multisite te
masking register, which allows the compactor to dynamically adapt to and provide excellent performance over a wide range
of x-densities. A major contribution of this paper is a technique
that enables the efficient loading of the x-masking data into
the masking logic in a parallel fashion using the scan chains.
A method for eliminating the requirement for dedicated mask control signals using automated test equipment timing flexibility is also presented. The proposed compactor is especially suited to multisite te -Abstract—This paper presents a highly effective compactor architecture for processing test responses with a high percentage of x-values. The key component is a hierarchical configurable
masking register, which allows the compactor to dynamically adapt to and provide excellent performance over a wide range
of x-densities. A major contribution of this paper is a technique
that enables the efficient loading of the x-masking data into
the masking logic in a parallel fashion using the scan chains.
A method for eliminating the requirement for dedicated mask control signals using automated test equipment timing flexibility is also presented. The proposed compactor is especially suited to multisite te
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hierarchical code\ddf.vhd
.................\dff.vhd
.................\DIF.vhd
.................\xchm.vhd
hierarchical code