通过对硅片图像的处理，实现对硅片中晶畴边缘的识别以及晶畴个数的统计，从而获得硅片结晶度的信息。克服了以往在太阳能电池生产过程中判断标准不统一、人工漏检等情况的发生，可实现由机器替代人工对每片衬底的检测。

项目的研究成果不仅可以应用在硅片衬底的检测上，对于其他低对比度图像，包含边缘提取以及面积统计等方面的处理，均可采用。这体现了本研究成果具有很强的实用性和很广的应用范围，具有很高的使用价值。

-Through the image processing to silicon chips, and to realize the dependence of ceramics edge silicon wafer recognition and then the number of statistics, to get the information crystallinity silicon chips. To overcome the previous in solar cell manufacturing process judgment standard not unity, artificial leak wait for the happening of the circumstance, can be achieved by machine to replace artificial each piece of substrate detection.

The research results of the project can be used not only in the silicon substrate detection, in the other low contrast images, including edge extraction and area of statistics, and other aspects of the handle, all can use. It shows the research results have very strong practicability and a very wide application range, has the very high use value.