文件名称:bist(1)
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In this paper, we have explained the purpose of FPGA testing. A built-in-self-test (BIST) is one type of testing. This test is performed internally to find any faults within a FPGA chip. This paper explains why testing is important to FPGAs. It also goes into detail in the design of the modules in the architecture and how the process works.
Pseudo-exhaustive pattern generators for built-in self-test (BIST) provide high fault coverage of detectable combinational faults with much fewer test vectors than exhaustive generation.
- In this paper, we have explained the purpose of FPGA testing. A built-in-self-test (BIST) is one type of testing. This test is performed internally to find any faults within a FPGA chip. This paper explains why testing is important to FPGAs. It also goes into detail in the design of the modules in the architecture and how the process works.
Pseudo-exhaustive pattern generators for built-in self-test (BIST) provide high fault coverage of detectable combinational faults with much fewer test vectors than exhaustive generation.
Pseudo-exhaustive pattern generators for built-in self-test (BIST) provide high fault coverage of detectable combinational faults with much fewer test vectors than exhaustive generation.
- In this paper, we have explained the purpose of FPGA testing. A built-in-self-test (BIST) is one type of testing. This test is performed internally to find any faults within a FPGA chip. This paper explains why testing is important to FPGAs. It also goes into detail in the design of the modules in the architecture and how the process works.
Pseudo-exhaustive pattern generators for built-in self-test (BIST) provide high fault coverage of detectable combinational faults with much fewer test vectors than exhaustive generation.
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下载文件列表
Bist_controller.v
BIST_TOP.v
Data_RAM.v
LFSR.v
MISR.v
shift.v
TRA.v
BIST_TOP.v
Data_RAM.v
LFSR.v
MISR.v
shift.v
TRA.v