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A major obstacle that stands in the way of efficient test
response compaction are the unknown values (x-values) captured
by scan cells during testing. If test responses with
x-values are compacted, some of the outputs of the compactor
may also take unknown values and the correctness of the
compactor inputs cannot be verified at the
limited compaction rates
response compaction are the unknown values (x-values) captured
by scan cells during testing. If test responses with
x-values are compacted, some of the outputs of the compactor
may also take unknown values and the correctness of the
compactor inputs cannot be verified at the
limited compaction rates
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下载文件列表
source\Command.vhd
......\control_interface.vhd
......\pll1.vhd
......\sdr_data_path.vhd
......\sdr_sdram.vhd
......\CVS
source