此程序用于检测EEPROM性能，测试方法如下：写入24c02一个数据，然后在内存中改变这些数据，

掉电后主内存将失去这些信息，然后从24c02中调入这些数据。看是否与写入的相同。这里用8个LED演示

　　　　函数是采用软件延时的方法产生SCL脉冲,固对高晶振频率要作 一定的修改....(本例是1us机器

　　　　周期,即晶振频率要小于12MHZ)-This procedure is used to detect EEPROM performance, test methods are as follows: a data write 24c02, and then change the data in memory, the memory power-down emperor will lose this information, and then transferred from the 24c02 in the data. And write to see if the same. Demonstrated here with 8 LED function is generated using the software method of delay SCL pulses, and reinforcement on the high frequency oscillator made some modifications to this case is 1us ....( machine cycle, the crystal frequency is less than 12MHZ)