为减少测试数据存储量,提出一种有效的新型测试数据压缩编码———PTIDR 编码,并构建了基于该编码的

压缩P解压缩方案1 PTIDR 编码能够取得比FDR ,EFDR , Alternating FDR 等编码更高的压缩率,其解码器也较简单、

易实现,且能有效地降低硬件开销1 与Selective Huffman , CDCR 编码相比,PTIDR 编码能够得到较高的压缩率面积

开销比1 特别地,在差分测试集中0 的概率满足p ≥017610 时,PTIDR 编码能取得比FDR 编码更高的压缩率,从而

降低芯片测试成本1-　We present a new test data compression and decompression architecture based on a novel and

efficient code , named PTIDR code1 The proposed approach can acquire better compression efficiency than

that of FDR (f requency2directed run2length) , EFDR (extended FDR) , alternating FDR etc1 The decoder

of PTIDR is also simpler , easier to realize and needs less hardware consumption1 Compared with algorithms

such as selective Huffman and CDCR (combining dictionary coding and L FSR reseeding) , PTIDR can ac2

quire higher CRPAR (ratio of compression ratio and area ratio) 1 Especially , when the probability of 0s in the

difference test set is greater than or equal to 017610 , it can acquire better compression efficiency than FDR

code , and thus , reducing the test cost of the chip1