JTAG+调试原理，中文版。这篇文章主要介绍ARM JTAG调试的基本原理。基本的内容包括了TAP (TEST ACCESS PORT) 和BOUNDARY-SCAN ARCHITECTURE的介绍，在此基础上，结合ARM7TDMI详细介绍了的JTAG调试原理。-JTAG+ debug principle, the Chinese version. This article introduces the basic principles of ARM JTAG debug. Basic elements include TAP (TEST ACCESS PORT) and BOUNDARY-SCAN ARCHITECTURE introduction, on this basis, combined with ARM7TDMI described in detail the principles of JTAG debugging.