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2407用户盘
- 本测试程序是针对TMS320LF2407 EVM的性能测试而设计开发的。程序运行时将按顺序对数据RAM空间、程序代码空间、片上异步串行通讯、ADC-DAC联合检测、双向数字I/O口、通用I/O和评估板LED、评估板并排手动开关分别进行检测。测试结果的正确或错误均有信息显示。-this test procedure is against TMS320LF2407 EVM performance testing and developmen
EBD7312_DAC
- EBD7312 DAC SDT 测试程序及驱动程序-EBD7312 DAC SDT testing procedures and Driver
DAC8534
- 本人编写的TI 16为DAC功能测试程序-I prepared for the 16 DAC TI functional test procedures
lf2407
- 闻亭公司的测试程序，包括LED、EEPROM、DAC、PLL、boot等程序。-Wen Ting companies testing procedures, including LED, EEPROM, DAC, PLL, boot, and other procedures.
DAC
- 闻亭TMS320LF2407开发板 数/模转换测试程序
DAC0832
- 基于单片机AT89S52系统的一些测试程序，用C语言编写的，自己已经做实验验证过了-Based on MCU AT89S52 system testing procedures, using C language, they have to do the experiment verified the
DAC
- 闻亭TMS320LF2407开发板 数/模转换测试程序
C8051F350program
- 含24bitAD的C8051F350单片机的测试程序，包含ADC,DAC,PWM,LCD,KEY,GPIO,UART,USB,EEPROM等外设的例程-Containing the C8051F350 MCU 24bitAD testing procedures, including ADC, DAC, PWM, LCD, KEY, GPIO, UART, USB, EEPROM peripheral routines and so o
SPI_DAC
- dspf2812 dac测试程序 用ccs2000编写-dspf2812 dac test procedure used to prepare ccs2000
Example
- Nanny Fpga开发板的正版测试程序，内含lcd1602液晶控制驱动程序，Ad9201模数转换器和AD5440数模转换器的驱动控制程序-Nanny Fpga Development Board of the Genuine test procedures, including control lcd1602 LCD driver, Ad9201 ADC and DAC AD5440 driver control procedures
FPGA_ADDA
- 基于 Cyclone EP1C6240C8的ADS2807，DAC2902 测试程序。主要用来使用FPGA控制ADC采集和DAC的输出，从而达到高频率信号处理的功能。首先从ADC2807采集数据，然后送给DAC2902输出。 采用FPGA口线模拟ADC2807和DAC2902的时序来实现。 提供ADC采样频率控制、DAC输出频率控制、输出波形控制、ADC通道转换、DAC通道转换等功能。-Based on Cyclone EP1C
DAC
- 火牛开发板的DAC测试程序，希望给大家帮助。-AC adapter test program development board of the DAC, want to give you help.
DAC
- DA测试程序,下载后可观察到10发光二极管由暗变亮再熄灭过程，-DA test program, the download can be observed in light-emitting diode 10 lights and then put out by the dark process
DAC
- C8051F020DK单片机DA转换测试程序，可下载直接使用，欢迎大家下载使用。-C8051F020DK microcontroller DA converter testing procedures can be downloaded directly, welcome everybody to download.
DAC
- 通道测试程序实例，用于测试系统AD通道的工作当输入高于2V时输出为高电平，低于2V时输出低电平-Instance of the channel test procedure used to test the AD channel when the input is higher than 2V, the output is high, output low when less than 2V
10.DAC
- 单片机开发板CT1702上的芯片PCF8591的DAC转换测试程序-SCM development board CT1702 chips on the DAC conversion PCF8591 test procedure
DAC-test
- 基于STM32F103ZE的DAC测试程序-The DAC test procedure based STM32F103ZE
DA_test
- 搭配DAC7724U ADC转换芯片测试程序。可产生方波、正弦波、三角波、锯齿波(With DAC7724U ADC conversion chip test program. Can produce Fang Bo, sine wave, triangle wave)
dac7744测试
- 16位DAC芯片DAC7744测试程序，可以测试DAC7744是否是好的，用示波器观察输出波形(16 bit DAC chip DAC7744 test program)
TLV5610-数采板程序 PDF
- 一份16位8路DAC模块的测试程序，所用芯片为TLV5610(16 bit eight - way DAC module test program)