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独走钢索
- 这里来了一群可恶的老鹰，它们居然停在大叔赖以保持平衡的长长竹杆上，等着看大叔的洋相呢……看看你可以挺多久？鼠标控制，移动鼠标来控制大叔身体的倾斜的方向。 -here to a group of hateful Atlanta, it was actually stopped at Uncle's balance of long bamboo poles. Wait to see it laid bare his uncle
littlegreenbats-svn2007.11.18.tar
- The Little Green BATS is the first and so far only Dutch team in the 3D simulation league. We are a group of graduate students from the department of AI at the University of Groningen, The Netherlands. Our team name is d
独走钢索
- 这里来了一群可恶的老鹰，它们居然停在大叔赖以保持平衡的长长竹杆上，等着看大叔的洋相呢……看看你可以挺多久？鼠标控制，移动鼠标来控制大叔身体的倾斜的方向。 -here to a group of hateful Atlanta, it was actually stopped at Uncle's balance of long bamboo poles. Wait to see it laid bare his uncle
littlegreenbats-svn2007.11.18.tar
- The Little Green BATS is the first and so far only Dutch team in the 3D simulation league. We are a group of graduate students from the department of AI at the University of Groningen, The Netherlands. Our team name is d
proc-ieee
- Broadband MIMO-OFDM Wireless Communications Gordon L. St¨uber, John Barry, Steve W. McLaughlin, Ye (Geoffrey) Li, Mary Ann Ingram, Thomas G. Pratt School of Electrical and Computer Engineering Georgia Institute o
work-boot-atlanta-2.tar
- Atlanta 2tm bootloader
first
- 兰大JAVA实验一 设计实验是自己写的 不是最好的 送给兰大学子 IS09PHB-Atlanta JAVA experiment write a design experiment is not the best sub IS09PHB give Tulane University
atalantadll
- 亚特兰大（ATPG算法），用于产生集成电路测试矢量的源代码 -Atlanta (ATPG algorithm),it is the source code that used to generate the the integrated circuit test vector
OPAUC
- One-Pass AUC 优化的matlab代码。参考文献：Wei Gao, Rong Jin, Shenghou Zhu and Zhi-Hua Zhou. One-Pass AUC Optimzation. In: Proceedings of the 30th International conference on Machine Learning (ICML 13), Atlanta, GA, 2013, JMLR: W&CP
contourletsd
- ContourletSD: MATLAB code implementing the new contourlet transform with sharp frequency localization as described in the following paper. Y. Lu and M. N. Do A new contourlet transform with sharp frequency localiz
Atalanta-M-2.0
- AUTOMATIC TEST PATTERN GENERATION TOOLBOX FOR VLSI TESTING AND FAULT COVERAGE MEASUREMENT