搜索资源列表
thin_film_N_K_T
- 通过测量光学薄膜的反射率曲线反演其光学常数，包括厚度与折射率
thin_film_N_K_T
- 通过测量光学薄膜的反射率曲线反演其光学常数，包括厚度与折射率-By measuring the optical thin film reflectivity curve inversion of its optical constants, including the thickness and refractive index
ant_imp
- 基于蚁群算法的薄膜椭偏建模分析算法，可同时反演三个变量，包括负折射率和厚度。-thin film analysis based on ant colony algorithm ellipsometry modeling, inversion of three variables simultaneously, including negative refractive index and thickness.
refraction
- 毕设时使用的折射率模型，反演了折射率与波长、盐水浓度的关系-Bi-based index model used, the inversion of the refractive index and the wavelength, the relationship between salt concentration
Desktop
- 测量光学薄膜的反射率曲线反演其光学常数，包括厚度与折射率-The true color image is converted into binary image
Inversional-gorithm
- 利用光散射理论，mie理论反演颗粒的直径和折射率-Using light scattering theory, mie theory inversion diameter and refractive index of the particles
Smith参数提取
- 由s11和s21的arg值与mag值提取得到相对介电常数和相对磁导率和折射率(The relative permittivity and relative permeability and refractive index are extracted from the Arg values and MAG values of S11 and S21.)
等效介质理论参数提取代码（原始）
- 根据S参数反演根据MATLAB来提取有效介电常数，磁导率和折射率。(Extraction of refractive index based on S parameters)
Desktop
- 用于计算超材料s参数提取折射率，介电常数，磁导率(S parameters to extract refractive index, dielectric constant and permeability)
NRWW
- 据S参数反演提取磁导率以及介电常数折射率(S parameters to extract permeability and dielectric constant)